Yujin Lim’s paper, “SELCC: Enhancing MLC Reliability and Endurance with Single Cell Error Correction Codes”, won the Best Paper Award (BPA) at the DATE 2024 conference.
This is the second time a Korean affiliation has won the award at DATE (and the first in the Test and Dependability track). This recognition highlights the paper’s impact on advancing multi-level cell memory technology reliability and endurance.